Abstract:
This work proposes the design and the realization of a 4-channel integrated and calibrated time-domain characterization system for the characterization of non-linear microwave devices. This integrated measurement system uses THA based receivers. This is a miniaturized, less expensive and comparable version of a similar laboratory available tool developed within XLIM. The integrated instrument developed in this work is fully calibrated. It is versatile with respect to sub-sampling techniques used to measure RF signals over very different acquisition times (<50ms or < few ms). The CIS technique is used for the periodic acquisition of periodic short duration RF signals. The DQD technique is used for the periodic or aperiodic acquisition of periodic or aperiodic RF signals. This tool was used to extract, from the measured time-domain waveforms at their ports, several characteristic parameters (AM/AM-AM/PM, EVM) of GaN amplifiers operating in the 10 to 50 W range and excited with simple or modulated signals. This manuscript also describes the implementation, and the development, performed along with the previous work, of a laboratory platform for remote practical works in the context of the European project TEMPUS EOLES.
